Subnanometer localization accuracy in widefield optical microscopy

The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue—overconfidence in measurement results with nanoscale statistical uncertainties that can be invalid due to mi...

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Detalles Bibliográficos
Autores principales: Copeland, Craig R., Geist, Jon, McGray, Craig D., Aksyuk, Vladimir A., Liddle, J. Alexander, Ilic, B. Robert, Stavis, Samuel M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6107003/
https://www.ncbi.nlm.nih.gov/pubmed/30839614
http://dx.doi.org/10.1038/s41377-018-0031-z

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6107003/
https://www.ncbi.nlm.nih.gov/pubmed/30839614
http://dx.doi.org/10.1038/s41377-018-0031-z

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