Massively parallel fabrication of crack-defined gold break junctions featuring sub-3 nm gaps for molecular devices

Break junctions provide tip-shaped contact electrodes that are fundamental components of nano and molecular electronics. However, the fabrication of break junctions remains notoriously time-consuming and difficult to parallelize. Here we demonstrate true parallel fabrication of gold break junctions...

Descripción completa

Detalles Bibliográficos
Autores principales: Dubois, Valentin, Raja, Shyamprasad N., Gehring, Pascal, Caneva, Sabina, van der Zant, Herre S. J., Niklaus, Frank, Stemme, Göran
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6109151/
https://www.ncbi.nlm.nih.gov/pubmed/30143636
http://dx.doi.org/10.1038/s41467-018-05785-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6109151/
https://www.ncbi.nlm.nih.gov/pubmed/30143636
http://dx.doi.org/10.1038/s41467-018-05785-2

Ejemplares similares