Accurate Measurements of Wall Shear Stress on a Plate with Elliptic Leading Edge

A micro-floating element wall shear stress sensor with backside connections has been developed for accurate measurements of wall shear stress under the turbulent boundary layer. The micro-sensor was designed and fabricated on a 10.16 cm SOI (Silicon on Insulator) wafer by MEMS (Micro-Electro-Mechani...

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Detalles Bibliográficos
Autores principales: Ding, Guang-Hui, Ma, Bing-He, Deng, Jin-Jun, Yuan, Wei-Zheng, Liu, Kang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6111537/
https://www.ncbi.nlm.nih.gov/pubmed/30111724
http://dx.doi.org/10.3390/s18082682

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6111537/
https://www.ncbi.nlm.nih.gov/pubmed/30111724
http://dx.doi.org/10.3390/s18082682

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