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Accurate Measurements of Wall Shear Stress on a Plate with Elliptic Leading Edge
A micro-floating element wall shear stress sensor with backside connections has been developed for accurate measurements of wall shear stress under the turbulent boundary layer. The micro-sensor was designed and fabricated on a 10.16 cm SOI (Silicon on Insulator) wafer by MEMS (Micro-Electro-Mechani...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6111537/ https://www.ncbi.nlm.nih.gov/pubmed/30111724 http://dx.doi.org/10.3390/s18082682 |