Modification of the AFM Sensor by a Precisely Regulated Air Stream to Increase Imaging Speed and Accuracy in the Contact Mode

Increasing the imaging rate of atomic force microscopy (AFM) without impairing of the imaging quality is a challenging task, since the increase in the scanning speed leads to a number of artifacts related to the limited mechanical bandwidth of the AFM components. One of these artifacts is the loss o...

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Detalles Bibliográficos
Autores principales: Dzedzickis, Andrius, Bucinskas, Vytautas, Viržonis, Darius, Sesok, Nikolaj, Ulcinas, Arturas, Iljin, Igor, Sutinys, Ernestas, Petkevicius, Sigitas, Gargasas, Justinas, Morkvenaite-Vilkonciene, Inga
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6111552/
https://www.ncbi.nlm.nih.gov/pubmed/30115868
http://dx.doi.org/10.3390/s18082694

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6111552/
https://www.ncbi.nlm.nih.gov/pubmed/30115868
http://dx.doi.org/10.3390/s18082694

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