A Non-Contact Measuring System for In-Situ Surface Characterization Based on Laser Confocal Microscopy

The characterization of surface topographic features on a component is typically quantified using two-dimensional roughness descriptors which are captured by off-line desktop instruments. Ideally any measurement system should be integrated into the manufacturing process to provide in-situ measuremen...

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Detalles Bibliográficos
Autores principales: Fu, Shaowei, Cheng, Fang, Tjahjowidodo, Tegoeh, Zhou, Yu, Butler, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6111828/
https://www.ncbi.nlm.nih.gov/pubmed/30104513
http://dx.doi.org/10.3390/s18082657

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6111828/
https://www.ncbi.nlm.nih.gov/pubmed/30104513
http://dx.doi.org/10.3390/s18082657

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