Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope

Scanning transmission electron microscopy (STEM) excels in accessing atomic-scale structure and chemistry. Enhancing our ability to directly image the functionalities of local features in materials has become one of the most important topics in the future development of STEM. Recently, differential...

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Detalles Bibliográficos
Autores principales: Hachtel, Jordan A., Idrobo, Juan Carlos, Chi, Miaofang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2018
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6132373/
https://www.ncbi.nlm.nih.gov/pubmed/30221126
http://dx.doi.org/10.1186/s40679-018-0059-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6132373/
https://www.ncbi.nlm.nih.gov/pubmed/30221126
http://dx.doi.org/10.1186/s40679-018-0059-4

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