Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS(2), MoSe(2), WS(2) and WSe(2)

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nano...

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Detalles Bibliográficos
Autores principales: Niu, Yue, Gonzalez-Abad, Sergio, Frisenda, Riccardo, Marauhn, Philipp, Drüppel, Matthias, Gant, Patricia, Schmidt, Robert, Taghavi, Najme S., Barcons, David, Molina-Mendoza, Aday J., de Vasconcellos, Steffen Michaelis, Bratschitsch, Rudolf, Perez De Lara, David, Rohlfing, Michael, Castellanos-Gomez, Andres
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6163246/
https://www.ncbi.nlm.nih.gov/pubmed/30223445
http://dx.doi.org/10.3390/nano8090725

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6163246/
https://www.ncbi.nlm.nih.gov/pubmed/30223445
http://dx.doi.org/10.3390/nano8090725

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