Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS(2), MoSe(2), WS(2) and WSe(2)

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS(2), MoSe(2), WS(2), and WSe(2), with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS(2), MoSe(2), WS(2), and WSe(2).