The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method

Forward modeling of diffraction peaks is a potential way to compare the results of theoretical mechanical simulations and experimental X-ray diffraction (XRD) data recorded during in situ experiments. As the input data are the strain or displacement field within a representative volume of the materi...

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Detalles Bibliográficos
Autores principales: Eloh, Komlavi Senyo, Jacques, Alain, Ribarik, Gabor, Berbenni, Stéphane
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6163892/
https://www.ncbi.nlm.nih.gov/pubmed/30205611
http://dx.doi.org/10.3390/ma11091669

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6163892/
https://www.ncbi.nlm.nih.gov/pubmed/30205611
http://dx.doi.org/10.3390/ma11091669

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