On the Use of Focused Incident Near-Field Beams in Microwave Imaging

We consider the use of focused incident near-field (NF) beams to interrogate the object of interest (OI) in NF microwave imaging (MWI). To this end, we first discuss how focused NF beams can be advantageously utilized to suppress scattering effects from the neighbouring objects whose unknown dielect...

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Detalles Bibliográficos
Autores principales: Bayat, Nozhan, Mojabi, Puyan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6165484/
https://www.ncbi.nlm.nih.gov/pubmed/30227593
http://dx.doi.org/10.3390/s18093127

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6165484/
https://www.ncbi.nlm.nih.gov/pubmed/30227593
http://dx.doi.org/10.3390/s18093127

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