Guidelines for establishing an etching procedure for dislocation density measurements on multicrystalline silicon samples

With multicrystalline silicon becoming the main material used for photovoltaic applications and dislocations being one of the main material limitations to better solar cell efficiency, etch pit density measurements are gaining more importance. Traditionally, etch pit density measurements are based o...

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Detalles Bibliográficos
Autores principales: Adamczyk, Krzysztof, Stokkan, Gaute, Di Sabatino, Marisa
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2018
Materias:
Materials Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6176788/
https://www.ncbi.nlm.nih.gov/pubmed/30310771
http://dx.doi.org/10.1016/j.mex.2018.09.013

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6176788/
https://www.ncbi.nlm.nih.gov/pubmed/30310771
http://dx.doi.org/10.1016/j.mex.2018.09.013

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