Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index

Both increased harvest index (HI) and increased dry matter (DM) are beneficial to yield; however, little is known about the priority of each under different yield levels. This paper aims to determine whether HI or DM is more important and identify the physiological attributes that act as indicators...

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Autores principales: Duan, Jianzhao, Wu, Yapeng, Zhou, Yi, Ren, Xingxu, Shao, Yunhui, Feng, Wei, Zhu, Yunji, He, Li, Guo, Tiancai
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6206259/
https://www.ncbi.nlm.nih.gov/pubmed/30405649
http://dx.doi.org/10.3389/fpls.2018.01457
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author Duan, Jianzhao
Wu, Yapeng
Zhou, Yi
Ren, Xingxu
Shao, Yunhui
Feng, Wei
Zhu, Yunji
He, Li
Guo, Tiancai
author_facet Duan, Jianzhao
Wu, Yapeng
Zhou, Yi
Ren, Xingxu
Shao, Yunhui
Feng, Wei
Zhu, Yunji
He, Li
Guo, Tiancai
author_sort Duan, Jianzhao
collection PubMed
description Both increased harvest index (HI) and increased dry matter (DM) are beneficial to yield; however, little is known about the priority of each under different yield levels. This paper aims to determine whether HI or DM is more important and identify the physiological attributes that act as indicators of increased yield. Two field experiments involving different cultivation patterns and water-nitrogen modes, respectively, were carried out from 2013 to 2016 in Huang-Huai Plain, China. Plant DM, leaf area index (LAI), and radiation interception (RI) were measured. Increased yield under low yield levels <7500 kg ha(-1) was attributed to an increase in both total DM and HI, while increases under higher yield levels >7500 kg ha(-1) were largely dependent on an increase in HI. Under high yield levels, HI showed a significant negative correlation with total DM and a parabolic relationship with net accumulation of DM during filling. Higher net accumulation of DM during filling helped slow down the decrease in HI, thereby maintaining a high value. Moreover, net DM accumulation during filling was positively correlated with yield, while post-anthesis accumulation showed a significant linear relationship with leaf area potential (LAP, R(2) = 0.404–0.526) and radiation interception potential (RIP, R(2) = 0.452–0.576) during grain filling. These findings suggest that the increase in LAP and RIP caused an increase in net DM accumulation after anthesis. Under DM levels >13,000 kg ha(-1) at anthesis, maintaining higher LAI and RI in lower layers during grain formation contributed to higher yield. Furthermore, the ratio of upper- to lower-layer RI showed a second-order curve with yield during filling, with an increase in the optimal range with grain development. Pre-anthesis translocation amount, translocation ratios and contribution ratios also showed second-order curves under high yield levels, with optimal values of 3000–4500 kg ha(-1), 25–35, and 30–50%, respectively. These results confirm the importance of HI in improving the yield, thereby providing a theoretical basis for wheat production in the Huang-Huai Plain.
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spelling pubmed-62062592018-11-07 Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index Duan, Jianzhao Wu, Yapeng Zhou, Yi Ren, Xingxu Shao, Yunhui Feng, Wei Zhu, Yunji He, Li Guo, Tiancai Front Plant Sci Plant Science Both increased harvest index (HI) and increased dry matter (DM) are beneficial to yield; however, little is known about the priority of each under different yield levels. This paper aims to determine whether HI or DM is more important and identify the physiological attributes that act as indicators of increased yield. Two field experiments involving different cultivation patterns and water-nitrogen modes, respectively, were carried out from 2013 to 2016 in Huang-Huai Plain, China. Plant DM, leaf area index (LAI), and radiation interception (RI) were measured. Increased yield under low yield levels <7500 kg ha(-1) was attributed to an increase in both total DM and HI, while increases under higher yield levels >7500 kg ha(-1) were largely dependent on an increase in HI. Under high yield levels, HI showed a significant negative correlation with total DM and a parabolic relationship with net accumulation of DM during filling. Higher net accumulation of DM during filling helped slow down the decrease in HI, thereby maintaining a high value. Moreover, net DM accumulation during filling was positively correlated with yield, while post-anthesis accumulation showed a significant linear relationship with leaf area potential (LAP, R(2) = 0.404–0.526) and radiation interception potential (RIP, R(2) = 0.452–0.576) during grain filling. These findings suggest that the increase in LAP and RIP caused an increase in net DM accumulation after anthesis. Under DM levels >13,000 kg ha(-1) at anthesis, maintaining higher LAI and RI in lower layers during grain formation contributed to higher yield. Furthermore, the ratio of upper- to lower-layer RI showed a second-order curve with yield during filling, with an increase in the optimal range with grain development. Pre-anthesis translocation amount, translocation ratios and contribution ratios also showed second-order curves under high yield levels, with optimal values of 3000–4500 kg ha(-1), 25–35, and 30–50%, respectively. These results confirm the importance of HI in improving the yield, thereby providing a theoretical basis for wheat production in the Huang-Huai Plain. Frontiers Media S.A. 2018-10-23 /pmc/articles/PMC6206259/ /pubmed/30405649 http://dx.doi.org/10.3389/fpls.2018.01457 Text en Copyright © 2018 Duan, Wu, Zhou, Ren, Shao, Feng, Zhu, He and Guo. http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
spellingShingle Plant Science
Duan, Jianzhao
Wu, Yapeng
Zhou, Yi
Ren, Xingxu
Shao, Yunhui
Feng, Wei
Zhu, Yunji
He, Li
Guo, Tiancai
Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index
title Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index
title_full Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index
title_fullStr Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index
title_full_unstemmed Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index
title_short Approach to Higher Wheat Yield in the Huang-Huai Plain: Improving Post-anthesis Productivity to Increase Harvest Index
title_sort approach to higher wheat yield in the huang-huai plain: improving post-anthesis productivity to increase harvest index
topic Plant Science
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6206259/
https://www.ncbi.nlm.nih.gov/pubmed/30405649
http://dx.doi.org/10.3389/fpls.2018.01457
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