Potential of ITO thin film for electrical probe memory applications

Electrical probe memory has received considerable attention during the last decade due to its prospective potential for the future mass storage device. However, the electrical probe device with conventional diamond-like carbon capping and bottom layers encounters with large interfacial contact resis...

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Detalles Bibliográficos
Autores principales: Wang, Lei, Wen, Jing, Yang, Cihui, Xiong, Bangshu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2018
Materias:
Optical, Magnetic and Electronic Device Materials
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6211315/
https://www.ncbi.nlm.nih.gov/pubmed/30397417
http://dx.doi.org/10.1080/14686996.2018.1534072

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6211315/
https://www.ncbi.nlm.nih.gov/pubmed/30397417
http://dx.doi.org/10.1080/14686996.2018.1534072

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