Three-beam convergent-beam electron diffraction for measuring crystallographic phases

Under almost all circumstances, electron diffraction patterns contain information about the phases of structure factors, a consequence of the short wavelength of an electron and its strong Coulombic interaction with matter. However, extracting this information remains a challenge and no generic meth...

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Detalles Bibliográficos
Autores principales: Guo, Yueming, Nakashima, Philip N. H., Etheridge, Joanne
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2018
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6211523/
https://www.ncbi.nlm.nih.gov/pubmed/30443359
http://dx.doi.org/10.1107/S2052252518012216

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6211523/
https://www.ncbi.nlm.nih.gov/pubmed/30443359
http://dx.doi.org/10.1107/S2052252518012216

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