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Three-beam convergent-beam electron diffraction for measuring crystallographic phases
Under almost all circumstances, electron diffraction patterns contain information about the phases of structure factors, a consequence of the short wavelength of an electron and its strong Coulombic interaction with matter. However, extracting this information remains a challenge and no generic meth...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2018
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6211523/ https://www.ncbi.nlm.nih.gov/pubmed/30443359 http://dx.doi.org/10.1107/S2052252518012216 |