Cargando…
Molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography
Complex nanoshaped structures (nanoshape structures here are defined as shapes enabled by sharp corners with radius of curvature <5 nm) have been shown to enable emerging nanoscale applications in energy, electronics, optics, and medicine. This nanoshaped fabrication at high throughput is well be...
Autores principales: | , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6220163/ https://www.ncbi.nlm.nih.gov/pubmed/31057893 http://dx.doi.org/10.1038/s41378-018-0007-4 |
_version_ | 1783368771709173760 |
---|---|
author | Cherala, Anshuman Sreenivasan, S. V. |
author_facet | Cherala, Anshuman Sreenivasan, S. V. |
author_sort | Cherala, Anshuman |
collection | PubMed |
description | Complex nanoshaped structures (nanoshape structures here are defined as shapes enabled by sharp corners with radius of curvature <5 nm) have been shown to enable emerging nanoscale applications in energy, electronics, optics, and medicine. This nanoshaped fabrication at high throughput is well beyond the capabilities of advanced optical lithography. While the highest-resolution e-beam processes (Gaussian beam tools with non-chemically amplified resists) can achieve <5 nm resolution, this is only available at very low throughputs. Large-area e-beam processes, needed for photomasks and imprint templates, are limited to ~18 nm half-pitch lines and spaces and ~20 nm half-pitch hole patterns. Using nanoimprint lithography, we have previously demonstrated the ability to fabricate precise diamond-like nanoshapes with ~3 nm radius corners over large areas. An exemplary shaped silicon nanowire ultracapacitor device was fabricated with these nanoshaped structures, wherein the half-pitch was 100 nm. The device significantly exceeded standard nanowire capacitor performance (by 90%) due to relative increase in surface area per unit projected area, enabled by the nanoshape. Going beyond the previous work, in this paper we explore the scaling of these nanoshaped structures to 10 nm half-pitch and below. At these scales a new “shape retention” resolution limit is observed due to polymer relaxation in imprint resists, which cannot be predicted with a linear elastic continuum model. An all-atom molecular dynamics model of the nanoshape structure was developed here to study this shape retention phenomenon and accurately predict the polymer relaxation. The atomistic framework is an essential modeling and design tool to extend the capability of imprint lithography to sub-10 nm nanoshapes. This framework has been used here to propose process refinements that maximize shape retention, and design template assist features (design for nanoshape retention) to achieve targeted nanoshapes. |
format | Online Article Text |
id | pubmed-6220163 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-62201632019-05-03 Molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography Cherala, Anshuman Sreenivasan, S. V. Microsyst Nanoeng Article Complex nanoshaped structures (nanoshape structures here are defined as shapes enabled by sharp corners with radius of curvature <5 nm) have been shown to enable emerging nanoscale applications in energy, electronics, optics, and medicine. This nanoshaped fabrication at high throughput is well beyond the capabilities of advanced optical lithography. While the highest-resolution e-beam processes (Gaussian beam tools with non-chemically amplified resists) can achieve <5 nm resolution, this is only available at very low throughputs. Large-area e-beam processes, needed for photomasks and imprint templates, are limited to ~18 nm half-pitch lines and spaces and ~20 nm half-pitch hole patterns. Using nanoimprint lithography, we have previously demonstrated the ability to fabricate precise diamond-like nanoshapes with ~3 nm radius corners over large areas. An exemplary shaped silicon nanowire ultracapacitor device was fabricated with these nanoshaped structures, wherein the half-pitch was 100 nm. The device significantly exceeded standard nanowire capacitor performance (by 90%) due to relative increase in surface area per unit projected area, enabled by the nanoshape. Going beyond the previous work, in this paper we explore the scaling of these nanoshaped structures to 10 nm half-pitch and below. At these scales a new “shape retention” resolution limit is observed due to polymer relaxation in imprint resists, which cannot be predicted with a linear elastic continuum model. An all-atom molecular dynamics model of the nanoshape structure was developed here to study this shape retention phenomenon and accurately predict the polymer relaxation. The atomistic framework is an essential modeling and design tool to extend the capability of imprint lithography to sub-10 nm nanoshapes. This framework has been used here to propose process refinements that maximize shape retention, and design template assist features (design for nanoshape retention) to achieve targeted nanoshapes. Nature Publishing Group UK 2018-04-23 /pmc/articles/PMC6220163/ /pubmed/31057893 http://dx.doi.org/10.1038/s41378-018-0007-4 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Cherala, Anshuman Sreenivasan, S. V. Molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography |
title | Molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography |
title_full | Molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography |
title_fullStr | Molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography |
title_full_unstemmed | Molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography |
title_short | Molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography |
title_sort | molecular dynamics modeling framework for overcoming nanoshape retention limits of imprint lithography |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6220163/ https://www.ncbi.nlm.nih.gov/pubmed/31057893 http://dx.doi.org/10.1038/s41378-018-0007-4 |
work_keys_str_mv | AT cheralaanshuman moleculardynamicsmodelingframeworkforovercomingnanoshaperetentionlimitsofimprintlithography AT sreenivasansv moleculardynamicsmodelingframeworkforovercomingnanoshaperetentionlimitsofimprintlithography |