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Root Mean Square Minimum Distance as a Quality Metric for Stochastic Optical Localization Nanoscopy Images

A localization algorithm in stochastic optical localization nanoscopy plays an important role in obtaining a high-quality image. A universal and objective metric is crucial and necessary to evaluate qualities of nanoscopy images and performances of localization algorithms. In this paper, we propose...

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Detalles Bibliográficos
Autor principal: Sun, Yi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6249279/
https://www.ncbi.nlm.nih.gov/pubmed/30464191
http://dx.doi.org/10.1038/s41598-018-35053-8