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Root Mean Square Minimum Distance as a Quality Metric for Stochastic Optical Localization Nanoscopy Images
A localization algorithm in stochastic optical localization nanoscopy plays an important role in obtaining a high-quality image. A universal and objective metric is crucial and necessary to evaluate qualities of nanoscopy images and performances of localization algorithms. In this paper, we propose...
Autor principal: | Sun, Yi |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6249279/ https://www.ncbi.nlm.nih.gov/pubmed/30464191 http://dx.doi.org/10.1038/s41598-018-35053-8 |
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