Dielectric Properties and Ion Transport in Layered MoS(2) Grown by Vapor-Phase Sulfurization for Potential Applications in Nanoelectronics

[Image: see text] Electronic and dielectric properties of vapor-phase grown MoS(2) have been investigated in metal/MoS(2)/silicon capacitor structures by capacitance–voltage and conductance-voltage techniques. Analytical methods confirm the MoS(2) layered structure, the presence of interfacial silic...

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Detalles Bibliográficos
Autores principales: Belete, Melkamu, Kataria, Satender, Koch, Ulrike, Kruth, Maximilian, Engelhard, Carsten, Mayer, Joachim, Engström, Olof, Lemme, Max C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2018
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6257629/
https://www.ncbi.nlm.nih.gov/pubmed/30506042
http://dx.doi.org/10.1021/acsanm.8b01412

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6257629/
https://www.ncbi.nlm.nih.gov/pubmed/30506042
http://dx.doi.org/10.1021/acsanm.8b01412

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