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Method of Calculating the Inductance Value of MEMS Suspended Inductors with Silicon Substrates
Microelectromechanical system (MEMS) suspended inductors have excellent radio-frequency (RF) performance. The inductance value is one of the main features that characterizes the performance of inductors. It is important to consider the influence of the substrate and the suspension height in calculat...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2018
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6265712/ https://www.ncbi.nlm.nih.gov/pubmed/30453626 http://dx.doi.org/10.3390/mi9110604 |
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author | Li, Yiyuan Li, Jianhua Xu, Lixin |
author_facet | Li, Yiyuan Li, Jianhua Xu, Lixin |
author_sort | Li, Yiyuan |
collection | PubMed |
description | Microelectromechanical system (MEMS) suspended inductors have excellent radio-frequency (RF) performance. The inductance value is one of the main features that characterizes the performance of inductors. It is important to consider the influence of the substrate and the suspension height in calculating the inductance value accurately. In this paper, a method is proposed to calculate the inductance value of the MEMS suspended inductor wire with a silicon substrate, as the wire is the basic component of the inductor coil. Then the method is extended to the suspended inductors consisting of a single turn coil. The calculation results obtained by this proposed method were verified by finite-element analysis (HFSS) and they were found to agree well with the results of the HFSS simulation. |
format | Online Article Text |
id | pubmed-6265712 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2018 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-62657122018-12-06 Method of Calculating the Inductance Value of MEMS Suspended Inductors with Silicon Substrates Li, Yiyuan Li, Jianhua Xu, Lixin Micromachines (Basel) Article Microelectromechanical system (MEMS) suspended inductors have excellent radio-frequency (RF) performance. The inductance value is one of the main features that characterizes the performance of inductors. It is important to consider the influence of the substrate and the suspension height in calculating the inductance value accurately. In this paper, a method is proposed to calculate the inductance value of the MEMS suspended inductor wire with a silicon substrate, as the wire is the basic component of the inductor coil. Then the method is extended to the suspended inductors consisting of a single turn coil. The calculation results obtained by this proposed method were verified by finite-element analysis (HFSS) and they were found to agree well with the results of the HFSS simulation. MDPI 2018-11-17 /pmc/articles/PMC6265712/ /pubmed/30453626 http://dx.doi.org/10.3390/mi9110604 Text en © 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Li, Yiyuan Li, Jianhua Xu, Lixin Method of Calculating the Inductance Value of MEMS Suspended Inductors with Silicon Substrates |
title | Method of Calculating the Inductance Value of MEMS Suspended Inductors with Silicon Substrates |
title_full | Method of Calculating the Inductance Value of MEMS Suspended Inductors with Silicon Substrates |
title_fullStr | Method of Calculating the Inductance Value of MEMS Suspended Inductors with Silicon Substrates |
title_full_unstemmed | Method of Calculating the Inductance Value of MEMS Suspended Inductors with Silicon Substrates |
title_short | Method of Calculating the Inductance Value of MEMS Suspended Inductors with Silicon Substrates |
title_sort | method of calculating the inductance value of mems suspended inductors with silicon substrates |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6265712/ https://www.ncbi.nlm.nih.gov/pubmed/30453626 http://dx.doi.org/10.3390/mi9110604 |
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