Observation of wet specimens sensitive to evaporation using scanning electron microscopy

Wet specimens are notoriously difficult to image in scanning electron microscopes (SEM) owing to evaporation from the required vacuum of the specimen chamber. Traditionally, this issue has been addressed by increasing the specimen chamber pressure. Unfortunately, observation under high specimen cham...

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Detalles Bibliográficos
Autores principales: Inoue, Noriyuki, Takashima, Yoshiko, Suga, Mitsuo, Suzuki, Toshiaki, Nemoto, Yoshikazu, Takai, Osamu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Oxford University Press 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6278750/
https://www.ncbi.nlm.nih.gov/pubmed/30307558
http://dx.doi.org/10.1093/jmicro/dfy041

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6278750/
https://www.ncbi.nlm.nih.gov/pubmed/30307558
http://dx.doi.org/10.1093/jmicro/dfy041

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