Nanoscale Lithium Quantification in Li(X)Ni(y)Co(w)Mn(Z)O(2) as Cathode for Rechargeable Batteries

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) using a focused ion-beam scanning electron microscope (FIB-SEM) is a promising and economical technique for lithium detection and quantification in battery materials because it overcomes the limitations with detecting low Li content by energy...

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Detalles Bibliográficos
Autores principales: Bessette, Stéphanie, Paolella, Andrea, Kim, Chisu, Zhu, Wen, Hovington, Pierre, Gauvin, Raynald, Zaghib, Karim
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6279772/
https://www.ncbi.nlm.nih.gov/pubmed/30514866
http://dx.doi.org/10.1038/s41598-018-33608-3

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6279772/
https://www.ncbi.nlm.nih.gov/pubmed/30514866
http://dx.doi.org/10.1038/s41598-018-33608-3

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