Anomalous diffusion along metal/ceramic interfaces

Interface diffusion along a metal/ceramic interface present in numerous energy and electronic devices can critically affect their performance and stability. Hole formation in a polycrystalline Ni film on an α-Al(2)O(3) substrate coupled with a continuum diffusion analysis demonstrates that Ni diffus...

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Detalles Bibliográficos
Autores principales: Kumar, Aakash, Barda, Hagit, Klinger, Leonid, Finnis, Michael W., Lordi, Vincenzo, Rabkin, Eugen, Srolovitz, David J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6286315/
https://www.ncbi.nlm.nih.gov/pubmed/30531799
http://dx.doi.org/10.1038/s41467-018-07724-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6286315/
https://www.ncbi.nlm.nih.gov/pubmed/30531799
http://dx.doi.org/10.1038/s41467-018-07724-7

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