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Ultimate limit in size and performance of WSe(2) vertical diodes

Precise doping-profile engineering in van der Waals heterostructures is a key element to promote optimal device performance in various electrical and optical applications with two-dimensional layered materials. Here, we report tungsten diselenide- (WSe(2)) based pure vertical diodes with atomically...

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Autores principales: Nazir, Ghazanfar, Kim, Hakseong, Kim, Jihwan, Kim, Kyoung Soo, Shin, Dong Hoon, Khan, Muhammad Farooq, Lee, Dong Su, Hwang, Jun Yeon, Hwang, Chanyong, Suh, Junho, Eom, Jonghwa, Jung, Suyong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6299081/
https://www.ncbi.nlm.nih.gov/pubmed/30560877
http://dx.doi.org/10.1038/s41467-018-07820-8
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author Nazir, Ghazanfar
Kim, Hakseong
Kim, Jihwan
Kim, Kyoung Soo
Shin, Dong Hoon
Khan, Muhammad Farooq
Lee, Dong Su
Hwang, Jun Yeon
Hwang, Chanyong
Suh, Junho
Eom, Jonghwa
Jung, Suyong
author_facet Nazir, Ghazanfar
Kim, Hakseong
Kim, Jihwan
Kim, Kyoung Soo
Shin, Dong Hoon
Khan, Muhammad Farooq
Lee, Dong Su
Hwang, Jun Yeon
Hwang, Chanyong
Suh, Junho
Eom, Jonghwa
Jung, Suyong
author_sort Nazir, Ghazanfar
collection PubMed
description Precise doping-profile engineering in van der Waals heterostructures is a key element to promote optimal device performance in various electrical and optical applications with two-dimensional layered materials. Here, we report tungsten diselenide- (WSe(2)) based pure vertical diodes with atomically defined p-, i- and n-channel regions. Externally modulated p- and n-doped layers are respectively formed on the bottom and the top facets of WSe(2) single crystals by direct evaporations of high and low work-function metals platinum and gadolinium, thus forming atomically sharp p–i–n heterojunctions in the homogeneous WSe(2) layers. As the number of layers increases, charge transport through the vertical WSe(2) p–i–n heterojunctions is characterized by a series of quantum tunneling events; direct tunneling, Fowler–Nordheim tunneling, and Schottky emission tunneling. With optimally selected WSe(2) thickness, our vertical heterojunctions show superb diode characteristics of an unprecedentedly high current density and low turn-on voltages while maintaining good current rectification.
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spelling pubmed-62990812018-12-20 Ultimate limit in size and performance of WSe(2) vertical diodes Nazir, Ghazanfar Kim, Hakseong Kim, Jihwan Kim, Kyoung Soo Shin, Dong Hoon Khan, Muhammad Farooq Lee, Dong Su Hwang, Jun Yeon Hwang, Chanyong Suh, Junho Eom, Jonghwa Jung, Suyong Nat Commun Article Precise doping-profile engineering in van der Waals heterostructures is a key element to promote optimal device performance in various electrical and optical applications with two-dimensional layered materials. Here, we report tungsten diselenide- (WSe(2)) based pure vertical diodes with atomically defined p-, i- and n-channel regions. Externally modulated p- and n-doped layers are respectively formed on the bottom and the top facets of WSe(2) single crystals by direct evaporations of high and low work-function metals platinum and gadolinium, thus forming atomically sharp p–i–n heterojunctions in the homogeneous WSe(2) layers. As the number of layers increases, charge transport through the vertical WSe(2) p–i–n heterojunctions is characterized by a series of quantum tunneling events; direct tunneling, Fowler–Nordheim tunneling, and Schottky emission tunneling. With optimally selected WSe(2) thickness, our vertical heterojunctions show superb diode characteristics of an unprecedentedly high current density and low turn-on voltages while maintaining good current rectification. Nature Publishing Group UK 2018-12-18 /pmc/articles/PMC6299081/ /pubmed/30560877 http://dx.doi.org/10.1038/s41467-018-07820-8 Text en © The Author(s) 2018 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Nazir, Ghazanfar
Kim, Hakseong
Kim, Jihwan
Kim, Kyoung Soo
Shin, Dong Hoon
Khan, Muhammad Farooq
Lee, Dong Su
Hwang, Jun Yeon
Hwang, Chanyong
Suh, Junho
Eom, Jonghwa
Jung, Suyong
Ultimate limit in size and performance of WSe(2) vertical diodes
title Ultimate limit in size and performance of WSe(2) vertical diodes
title_full Ultimate limit in size and performance of WSe(2) vertical diodes
title_fullStr Ultimate limit in size and performance of WSe(2) vertical diodes
title_full_unstemmed Ultimate limit in size and performance of WSe(2) vertical diodes
title_short Ultimate limit in size and performance of WSe(2) vertical diodes
title_sort ultimate limit in size and performance of wse(2) vertical diodes
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6299081/
https://www.ncbi.nlm.nih.gov/pubmed/30560877
http://dx.doi.org/10.1038/s41467-018-07820-8
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