Lift-off Effect for Capacitive Imaging Sensors

Capacitive Imaging (CI) sensors are capable of non-destructively detecting both surface and hidden defects in dielectric materials and characterizing conducting surfaces through a relatively thick insulation layer. However, the complex Measurement Sensitivity Distribution (MSD) of CI sensors render...

Descripción completa

Detalles Bibliográficos
Autores principales: Yin, Xiaokang, Li, Chen, Li, Zhen, Li, Wei, Chen, Guoming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6308521/
https://www.ncbi.nlm.nih.gov/pubmed/30563150
http://dx.doi.org/10.3390/s18124286

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6308521/
https://www.ncbi.nlm.nih.gov/pubmed/30563150
http://dx.doi.org/10.3390/s18124286

Ejemplares similares