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Remote Phonon Scattering in Two-Dimensional InSe FETs with High-κ Gate Stack

This work focuses on the effect of remote phonon arising from the substrate and high-κ gate dielectric on electron mobility in two-dimensional (2D) InSe field-effect transistors (FETs). The electrostatic characteristic under quantum confinement is derived by self-consistently solving the Poisson and...

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Detalles Bibliográficos
Autores principales: Chang, Pengying, Liu, Xiaoyan, Liu, Fei, Du, Gang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6316064/
https://www.ncbi.nlm.nih.gov/pubmed/30572574
http://dx.doi.org/10.3390/mi9120674