A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis

A new method to estimate the trajectories of particle motion and the amount of cumulative beam damage in electron cryo-microscopy (cryo-EM) single-particle analysis is presented. The motion within the sample is modelled through the use of Gaussian process regression. This allows a prior likelihood t...

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Detalles Bibliográficos
Autores principales: Zivanov, Jasenko, Nakane, Takanori, Scheres, Sjors H. W.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6327179/
https://www.ncbi.nlm.nih.gov/pubmed/30713699
http://dx.doi.org/10.1107/S205225251801463X

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6327179/
https://www.ncbi.nlm.nih.gov/pubmed/30713699
http://dx.doi.org/10.1107/S205225251801463X

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