Controllable Tunneling Triboelectrification of Two-Dimensional Chemical Vapor Deposited MoS(2)

Tunneling triboelectrification of chemical vapor deposited monolayer MoS(2) has been characterized at nanoscale with contact-mode atomic force microscopy (AFM) and Kelvin force microscopy (KFM). Although charges can be trapped on insulators like SiO(2) by conventional triboelectrification, triboelec...

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Detalles Bibliográficos
Autores principales: Wang, He, Huang, Chung-Che, Polcar, Tomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6344571/
https://www.ncbi.nlm.nih.gov/pubmed/30674961
http://dx.doi.org/10.1038/s41598-018-36830-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6344571/
https://www.ncbi.nlm.nih.gov/pubmed/30674961
http://dx.doi.org/10.1038/s41598-018-36830-1

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