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Imaging of local structures affecting electrical transport properties of large graphene sheets by lock-in thermography

The distribution of defects and dislocations in graphene layers has become a very important concern with regard to the electrical and electronic transport properties of device applications. Although several experiments have shown the influence of defects on the electrical properties of graphene, the...

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Detalles Bibliográficos
Autores principales: Nakajima, H., Morimoto, T., Okigawa, Y., Yamada, T., Ikuta, Y., Kawahara, K., Ago, H., Okazaki, T.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Association for the Advancement of Science 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6358317/
https://www.ncbi.nlm.nih.gov/pubmed/30746485
http://dx.doi.org/10.1126/sciadv.aau3407