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Imaging of local structures affecting electrical transport properties of large graphene sheets by lock-in thermography
The distribution of defects and dislocations in graphene layers has become a very important concern with regard to the electrical and electronic transport properties of device applications. Although several experiments have shown the influence of defects on the electrical properties of graphene, the...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Association for the Advancement of Science
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6358317/ https://www.ncbi.nlm.nih.gov/pubmed/30746485 http://dx.doi.org/10.1126/sciadv.aau3407 |