Electrically Robust Single‐Crystalline WTe(2) Nanobelts for Nanoscale Electrical Interconnects

As the elements of integrated circuits are downsized to the nanoscale, the current Cu‐based interconnects are facing limitations due to increased resistivity and decreased current‐carrying capacity because of scaling. Here, the bottom‐up synthesis of single‐crystalline WTe(2) nanobelts and low‐ and...

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Detalles Bibliográficos
Autores principales: Song, Seunguk, Kim, Se‐Yang, Kwak, Jinsung, Jo, Yongsu, Kim, Jung Hwa, Lee, Jong Hwa, Lee, Jae‐Ung, Kim, Jong Uk, Yun, Hyung Duk, Sim, Yeoseon, Wang, Jaewon, Lee, Do Hee, Seok, Shi‐Hyun, Kim, Tae‐il, Cheong, Hyeonsik, Lee, Zonghoon, Kwon, Soon‐Yong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2018
Materias:
Full Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6364501/
https://www.ncbi.nlm.nih.gov/pubmed/30775229
http://dx.doi.org/10.1002/advs.201801370

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6364501/
https://www.ncbi.nlm.nih.gov/pubmed/30775229
http://dx.doi.org/10.1002/advs.201801370

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