In-situ preparation of plant samples in ESEM for energy dispersive x-ray microanalysis and repetitive observation in SEM and ESEM

The Extended Low Temperature Method (ELTM) for the in-situ preparation of plant samples in an environmental scanning electron microscope enables carrying out repetitive topographical and material analysis at a higher resolution in the vacuum conditions of a scanning electron microscope or in the low...

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Detalles Bibliográficos
Autores principales: Tihlaříková, Eva, Neděla, Vilém, Đorđević, Biljana
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6381206/
https://www.ncbi.nlm.nih.gov/pubmed/30783188
http://dx.doi.org/10.1038/s41598-019-38835-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6381206/
https://www.ncbi.nlm.nih.gov/pubmed/30783188
http://dx.doi.org/10.1038/s41598-019-38835-w

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