Understanding Current Instabilities in Conductive Atomic Force Microscopy

Conductive atomic force microscopy (CAFM) is one of the most powerful techniques in studying the electrical properties of various materials at the nanoscale. However, understanding current fluctuations within one study (due to degradation of the probe tips) and from one study to another (due to the...

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Detalles Bibliográficos
Autores principales: Jiang, Lanlan, Weber, Jonas, Puglisi, Francesco Maria, Pavan, Paolo, Larcher, Luca, Frammelsberger, Werner, Benstetter, Guenther, Lanza, Mario
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6384822/
https://www.ncbi.nlm.nih.gov/pubmed/30717254
http://dx.doi.org/10.3390/ma12030459

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6384822/
https://www.ncbi.nlm.nih.gov/pubmed/30717254
http://dx.doi.org/10.3390/ma12030459

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