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Growth Characterization of Intermetallic Compound at the Ti/Al Solid State Interface
Ti-Al diffusion couples, prepared by resistance spot welding, were annealed up to 112 h at 823, 848, and 873 K in ambient atmosphere. The interfacial microstructure was observed and analyzed using SEM and TEM. The growth characterization of intermetallic compound formed at the Ti/Al solid state inte...
Autores principales: | Zhao, Yangyang, Li, Jiuyong, Qiu, Ranfeng, Shi, Hongxin |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6384985/ https://www.ncbi.nlm.nih.gov/pubmed/30720709 http://dx.doi.org/10.3390/ma12030472 |
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