Analysis of Disparity Information for Depth Extraction Using CMOS Image Sensor with Offset Pixel Aperture Technique †

A complementary metal oxide semiconductor (CMOS) image sensor (CIS), using offset pixel aperture (OPA) technique, was designed and fabricated using the 0.11-µm CIS process. In conventional cameras, an aperture is located on the camera lens. However, in a CIS camera using OPA technique, apertures are...

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Detalles Bibliográficos
Autores principales: Choi, Byoung-Soo, Lee, Jimin, Kim, Sang-Hwan, Chang, Seunghyuk, Park, JongHo, Lee, Sang-Jin, Shin, Jang-Kyoo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6387063/
https://www.ncbi.nlm.nih.gov/pubmed/30682783
http://dx.doi.org/10.3390/s19030472

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6387063/
https://www.ncbi.nlm.nih.gov/pubmed/30682783
http://dx.doi.org/10.3390/s19030472

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