Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions

The estimation of the reliability of magnetic field sensors against failure is a critical point concerning their application for industrial purposes. Due to the physical stochastic nature of the failure events, this can only be done by means of a statistical approach which is extremely time consumin...

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Detalles Bibliográficos
Autores principales: Conca Parra, Andrés, Casper, Frederick, Paul, Johannes, Lehndorff, Ronald, Haupt, Christian, Jakob, Gerhard, Kläui, Mathias, Hillebrands, Burkard
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6387249/
https://www.ncbi.nlm.nih.gov/pubmed/30704095
http://dx.doi.org/10.3390/s19030583

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6387249/
https://www.ncbi.nlm.nih.gov/pubmed/30704095
http://dx.doi.org/10.3390/s19030583

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