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Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions
The estimation of the reliability of magnetic field sensors against failure is a critical point concerning their application for industrial purposes. Due to the physical stochastic nature of the failure events, this can only be done by means of a statistical approach which is extremely time consumin...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6387249/ https://www.ncbi.nlm.nih.gov/pubmed/30704095 http://dx.doi.org/10.3390/s19030583 |