Wavelength-dependent Optical Instability Mechanisms and Decay Kinetics in Amorphous Oxide Thin-Film Devices

We present a study on decay kinetics for a recovery process depending on the light wavelength selected in optical instability measurements against amorphous In-Ga-Zn-O (a-IGZO) thin-film devices. To quantitatively analyze optically-induced instability behaviors, a stretched exponential function (SEF...

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Detalles Bibliográficos
Autores principales: Bae, Junyoung, Jeong, Inkyung, Lee, Sungsik
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6393424/
https://www.ncbi.nlm.nih.gov/pubmed/30814592
http://dx.doi.org/10.1038/s41598-019-39744-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6393424/
https://www.ncbi.nlm.nih.gov/pubmed/30814592
http://dx.doi.org/10.1038/s41598-019-39744-8

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