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Single-shot deflectometry for dynamic 3D surface profile measurement by modified spatial-carrier frequency phase-shifting method

We propose a new concept of single-shot deflectometry for real-time measurement of three-dimensional surface profile using a single composite pattern. To retrieve an accurate phase from one-frame composite pattern, we adapt the Fourier Transform (FT) method and the spatial carrier-frequency phase-sh...

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Detalles Bibliográficos
Autores principales: Nguyen, Manh The, Ghim, Young-Sik, Rhee, Hyug-Gyo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6395726/
https://www.ncbi.nlm.nih.gov/pubmed/30816212
http://dx.doi.org/10.1038/s41598-019-39514-6