Resolving 500 nm axial separation by multi-slice X-ray ptychography

Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the...

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Detalles Bibliográficos
Autores principales: Huang, Xiaojing, Yan, Hanfei, He, Yan, Ge, Mingyuan, Öztürk, Hande, Fang, Yao-Lung L., Ha, Sungsoo, Lin, Meifeng, Lu, Ming, Nazaretski, Evgeny, Robinson, Ian K., Chu, Yong S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6396394/
https://www.ncbi.nlm.nih.gov/pubmed/30821266
http://dx.doi.org/10.1107/S2053273318017229

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6396394/
https://www.ncbi.nlm.nih.gov/pubmed/30821266
http://dx.doi.org/10.1107/S2053273318017229

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