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Resolving 500 nm axial separation by multi-slice X-ray ptychography

Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the...

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Autores principales: Huang, Xiaojing, Yan, Hanfei, He, Yan, Ge, Mingyuan, Öztürk, Hande, Fang, Yao-Lung L., Ha, Sungsoo, Lin, Meifeng, Lu, Ming, Nazaretski, Evgeny, Robinson, Ian K., Chu, Yong S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6396394/
https://www.ncbi.nlm.nih.gov/pubmed/30821266
http://dx.doi.org/10.1107/S2053273318017229
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author Huang, Xiaojing
Yan, Hanfei
He, Yan
Ge, Mingyuan
Öztürk, Hande
Fang, Yao-Lung L.
Ha, Sungsoo
Lin, Meifeng
Lu, Ming
Nazaretski, Evgeny
Robinson, Ian K.
Chu, Yong S.
author_facet Huang, Xiaojing
Yan, Hanfei
He, Yan
Ge, Mingyuan
Öztürk, Hande
Fang, Yao-Lung L.
Ha, Sungsoo
Lin, Meifeng
Lu, Ming
Nazaretski, Evgeny
Robinson, Ian K.
Chu, Yong S.
author_sort Huang, Xiaojing
collection PubMed
description Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the specimen. Here, we present an experimental demonstration that resolves two layers of nanostructures separated by 500 nm along the axial direction, with sub-10 nm and sub-20 nm resolutions on two layers, respectively. Fluorescence maps are simultaneously measured in the multi-modality imaging scheme to assist in decoupling the mixture of low-spatial-frequency features across different slices. The enhanced axial sectioning capability using correlative signals obtained from multi-modality measurements demonstrates the great potential of the multi-slice ptychography method for investigating specimens with extended dimensions in 3D with high resolution.
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spelling pubmed-63963942019-03-13 Resolving 500 nm axial separation by multi-slice X-ray ptychography Huang, Xiaojing Yan, Hanfei He, Yan Ge, Mingyuan Öztürk, Hande Fang, Yao-Lung L. Ha, Sungsoo Lin, Meifeng Lu, Ming Nazaretski, Evgeny Robinson, Ian K. Chu, Yong S. Acta Crystallogr A Found Adv Research Papers Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the specimen. Here, we present an experimental demonstration that resolves two layers of nanostructures separated by 500 nm along the axial direction, with sub-10 nm and sub-20 nm resolutions on two layers, respectively. Fluorescence maps are simultaneously measured in the multi-modality imaging scheme to assist in decoupling the mixture of low-spatial-frequency features across different slices. The enhanced axial sectioning capability using correlative signals obtained from multi-modality measurements demonstrates the great potential of the multi-slice ptychography method for investigating specimens with extended dimensions in 3D with high resolution. International Union of Crystallography 2019-02-12 /pmc/articles/PMC6396394/ /pubmed/30821266 http://dx.doi.org/10.1107/S2053273318017229 Text en © Xiaojing Huang et al. 2019 http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/4.0/
spellingShingle Research Papers
Huang, Xiaojing
Yan, Hanfei
He, Yan
Ge, Mingyuan
Öztürk, Hande
Fang, Yao-Lung L.
Ha, Sungsoo
Lin, Meifeng
Lu, Ming
Nazaretski, Evgeny
Robinson, Ian K.
Chu, Yong S.
Resolving 500 nm axial separation by multi-slice X-ray ptychography
title Resolving 500 nm axial separation by multi-slice X-ray ptychography
title_full Resolving 500 nm axial separation by multi-slice X-ray ptychography
title_fullStr Resolving 500 nm axial separation by multi-slice X-ray ptychography
title_full_unstemmed Resolving 500 nm axial separation by multi-slice X-ray ptychography
title_short Resolving 500 nm axial separation by multi-slice X-ray ptychography
title_sort resolving 500 nm axial separation by multi-slice x-ray ptychography
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6396394/
https://www.ncbi.nlm.nih.gov/pubmed/30821266
http://dx.doi.org/10.1107/S2053273318017229
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