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Resolving 500 nm axial separation by multi-slice X-ray ptychography
Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the...
Autores principales: | Huang, Xiaojing, Yan, Hanfei, He, Yan, Ge, Mingyuan, Öztürk, Hande, Fang, Yao-Lung L., Ha, Sungsoo, Lin, Meifeng, Lu, Ming, Nazaretski, Evgeny, Robinson, Ian K., Chu, Yong S. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6396394/ https://www.ncbi.nlm.nih.gov/pubmed/30821266 http://dx.doi.org/10.1107/S2053273318017229 |
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