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Resolving indexing ambiguities in X-ray free-electron laser diffraction patterns

Processing X-ray free-electron laser (XFEL) diffraction images poses challenges, as an XFEL pulse is powerful enough to destroy or damage the diffracting volume and thereby yields only one diffraction image per volume. Moreover, the crystal is stationary during the femtosecond pulse, so reflections...

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Detalles Bibliográficos
Autores principales: Uervirojnangkoorn, Monarin, Lyubimov, Artem Y., Zhou, Qiangjun, Weis, William I., Brunger, Axel T.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6400252/
https://www.ncbi.nlm.nih.gov/pubmed/30821711
http://dx.doi.org/10.1107/S2059798318013177