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Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy
Defects in materials give rise to fluctuations in electrostatic fields that reflect the local charge density, but imaging this with single atom sensitivity is challenging. However, if possible, this provides information about the energetics of adatom binding, localized conduction channels, molecular...
Autores principales: | Fang, Shiang, Wen, Yi, Allen, Christopher S., Ophus, Colin, Han, Grace G. D., Kirkland, Angus I., Kaxiras, Efthimios, Warner, Jamie H. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6408534/ https://www.ncbi.nlm.nih.gov/pubmed/30850616 http://dx.doi.org/10.1038/s41467-019-08904-9 |
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