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Å-Indentation for non-destructive elastic moduli measurements of supported ultra-hard ultra-thin films and nanostructures

During conventional nanoindentation measurements, the indentation depths are usually larger than 1–10 nm, which hinders the ability to study ultra-thin films (<10 nm) and supported atomically thin two-dimensional (2D) materials. Here, we discuss the development of modulated Å-indentation to achie...

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Detalles Bibliográficos
Autores principales: Cellini, Filippo, Gao, Yang, Riedo, Elisa
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6411981/
https://www.ncbi.nlm.nih.gov/pubmed/30858472
http://dx.doi.org/10.1038/s41598-019-40636-0