Theoretical Study on Synchronous Characterization of Surface and Interfacial Mechanical Properties of Thin-Film/Substrate Systems with Residual Stress Based on Pressure Blister Test Technique

In this study, based on the pressure blister test technique, a theoretical study on the synchronous characterization of surface and interfacial mechanical properties of thin-film/substrate systems with residual stress was presented, where the problem of axisymmetric deformation of a blistering film...

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Detalles Bibliográficos
Autores principales: Yang, Zhi-xin, Sun, Jun-yi, Li, Ke, Lian, Yong-sheng, He, Xiao-ting, Zheng, Zhou-lian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2018
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6414978/
https://www.ncbi.nlm.nih.gov/pubmed/30966085
http://dx.doi.org/10.3390/polym10010049

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6414978/
https://www.ncbi.nlm.nih.gov/pubmed/30966085
http://dx.doi.org/10.3390/polym10010049

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