Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements

The knowledge of minority carrier lifetime of a semiconductor is important for the assessment of its quality and design of electronic devices. Time-resolved photoluminescence (TRPL) measurements offer the possibility to extract effective lifetimes in the nanosecond range. However, it is difficult to...

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Detalles Bibliográficos
Autores principales: Weiss, Thomas P., Bissig, Benjamin, Feurer, Thomas, Carron, Romain, Buecheler, Stephan, Tiwari, Ayodhya N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6440953/
https://www.ncbi.nlm.nih.gov/pubmed/30926885
http://dx.doi.org/10.1038/s41598-019-41716-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6440953/
https://www.ncbi.nlm.nih.gov/pubmed/30926885
http://dx.doi.org/10.1038/s41598-019-41716-x

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