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Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements
The knowledge of minority carrier lifetime of a semiconductor is important for the assessment of its quality and design of electronic devices. Time-resolved photoluminescence (TRPL) measurements offer the possibility to extract effective lifetimes in the nanosecond range. However, it is difficult to...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6440953/ https://www.ncbi.nlm.nih.gov/pubmed/30926885 http://dx.doi.org/10.1038/s41598-019-41716-x |