Indexing grazing-incidence X-ray diffraction patterns of thin films: lattices of higher symmetry

Grazing-incidence X-ray diffraction studies on organic thin films are often performed on systems showing fibre-textured growth. However, indexing their experimental diffraction patterns is generally challenging, especially if low-symmetry lattices are involved. Recently, analytical mathematical expr...

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Detalles Bibliográficos
Autores principales: Simbrunner, Josef, Hofer, Sebastian, Schrode, Benedikt, Garmshausen, Yves, Hecht, Stefan, Resel, Roland, Salzmann, Ingo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6448685/
https://www.ncbi.nlm.nih.gov/pubmed/30996719
http://dx.doi.org/10.1107/S1600576719003029

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6448685/
https://www.ncbi.nlm.nih.gov/pubmed/30996719
http://dx.doi.org/10.1107/S1600576719003029

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